VIEW Engineering: The Origins of Automated Optical Metrology In the 1970s, rapid advances in manufacturing created a growing need for automated optical measurement. CNC machining dramatically increased production speeds, while Statistical Process Control (SPC) required accurate, repeatable measurement data to maintain quality. At the same time, shrinking component sizes and...
Combines Siemens’ EDA expertise and software with NVIDIA AI infrastructure and software to improve result quality, time-to-results, tool-calling reliability and token efficiency for long-running engineering workloads Enables agentic AI workflows that help engineers improve productivity and design quality across the electronic design automation (EDA) lifecycle Delivers more predictable, trusted outcomes...
A patient who can no longer speak generates text directly from neural activity. A patient with paralysis controls a cursor using thought alone. Behind demonstrations like these is a difficult engineering problem: how do you assemble electronics delicate enough to interact with the human brain, while keeping them stable inside...
By Thomas McMahon Naval Surface Warfare Center, Port Hueneme Division, CA Sailors can now get certified in operating and maintaining the fleet’s most prevalent directed energy system through a new training program at Naval Surface Warfare Center, Port Hueneme Division (NSWC PHD)’s Directed Energy Systems Integration Laboratory (DESIL), with the first...
As federal agencies and defense organizations race to modernize the technologies that underpin national security, the semiconductor industry has entered...
Fan-out wafer-level packaging (FOWLP) has become one of the most important packaging architectures in modern microelectronics. It enables the miniaturization...
The rapid development of artificial intelligence (AI), high-performance computing (HPC), and hyperscale data centers is creating unprecedented demand for bandwidth...
Introduction Even experienced electronics engineers can overlook design decisions that appear minor during development but later result in higher manufacturing...
Wafer cleaning is one of the most critical steps in the semiconductor process flow, especially as dimensions continue to shrink to below the 1-nanometer (nm) node. Photoresist residue and particulates can...
$1.5 Billion Multi-Year Advanced Packaging and Development Agreement to Support Expansion of Amkor’s U.S. Advanced Packaging Capacity Amkor Technology, Inc. today...
Multilayer ceramic capacitors (MLCCs) are widely used electronic components made by stacking many thin ceramic dielectric layers with internal electrodes....