Chiplets have become a strategic asset for designers who are implementing them in all sorts of applications. Until now, chiplet verification until now has been overlooked. I discussed this phenomenon with Dave Kelf, CEO of Breker Verification Systems, an ESD Alliance member company and provider of verification solutions that leverage...
Editor’s Note: Bob Smith, executive director of the ESD Alliance, a SEMI Technology Community, is a regular contributor to 3D InCites. He turns over his blog today to John Lee of Ansys, an ESD Alliance member company, who describes a disruptive change in product engineering and the requirements of the...
For 5G smartphones and other millimeter-wave (mmWave) applications, antenna integration, either through antenna-in-package (AiP) or antenna-on-package (AoP) technologies, simplifies the challenges associated with designing products that operate at these high frequencies. A variety of AiP/AoP design methodologies provide the required form, fit, and function for these applications and can include...
We have known for some time that with scaling coming to an end the industry would need to find another way to continue moving forward. One of the options is known as SoC disintegration, which is when a system-on-chip (SoC) is disintegrated into its functional parts and then connect these...
Advanced packaging has continued to evolve with various interconnect technologies on their way towards heterogeneous integration. Different assembly processes are...
Understanding the role of compromises and trade-offs in the design process Electronic packages serve many purposes including protecting, connecting, and...
Artificial intelligence and machine learning (AI/ML) can have various applications in smart manufacturing for semiconductor fab, advanced packaging, and electronics...
Electronics Packaging vs. Advanced Packaging Electronics packaging is generally divided into three major areas, traditional packaging – also called standard...
Determining the causes of failures in semiconductors often requires removing overlying material to expose the failed circuit element for high-resolution...