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A Legacy of Innovation: Celebrating 50 Years of VIEW Micro Metrology

VIEW Engineering:  The Origins of Automated Optical Metrology In the 1970s, rapid advances in manufacturing created a growing need for automated optical measurement. CNC machining dramatically increased production speeds, while Statistical Process Control (SPC) required accurate, repeatable measurement data to maintain quality. At the same time, shrinking component sizes and...

Siemens advances self-verifying agentic AI workflows for semiconductor and PCB design

Combines Siemens’ EDA expertise and software with NVIDIA AI infrastructure and software to improve result quality, time-to-results, tool-calling reliability and token efficiency for long-running engineering workloads Enables agentic AI workflows that help engineers improve productivity and design quality across the electronic design automation (EDA) lifecycle Delivers more predictable, trusted outcomes...

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