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Topics of Discussion at GIT 2014

In my previous post I talked a bit about the ongoing debate that went on during last week’s Global Interposer Technology Workshop (GIT 2014) which took place at Georgia Tech’s Global Learning Center. Do we wait for the “trickle down” effect to take place and bring the cost of interposer and...

Having the Courage to Design in 3D TSVs

I don’t know why it still surprises me to read conflicting reports on the progress of 3D TSVs. But I think Ron Huemoeller, Amkor, finally hit on it in his closing remarks during today’s webcast, “TSV Packaging at the Tipping Point”, moderated by Pete Singer, Solid StateTechnology/Extension Media. Huemoeller’s presentation and...

SORIN CRM: 3D IC Module for Active Medical Implant

Manufacturing of 3D IC heterogeneous integrated modules for the electronics of a leadless pacemaker in a very small volume has been realized. Manufacturing of 3D IC modules using the described process is ready for medium volume production. Testimonial All the electronics of a leadless pacemaker has been integrated into a...

ECTC 2014: Bridging the Gap to 2.5D and 3D

Each year since I first attended the IEEE Electronic Component Technology Conference (ECTC) in 2009, the keynotes, panels and papers focused on 2.5D and 3D integration technologies has increased; every year, that is, until this year. At ECTC 2014, there were not any plenary or panels focused specifically on 2.5D...

SEMICON Singapore 2014: A Rosy Outlook for 2.5D and 3D ICs

This week, at the invitation of SEMI Southeast Asia, I made the monumental trek from Phoenix, AZ to Singapore to attend SEMICON Singapore. While I know many of my industry colleagues make these journeys in the regular course of business, this was a new experience for me and my first...

Cascade Microtech Breaks Through the Barriers of 3D Test

For quite some time, the lack of cost-effective test solutions for 2.5D interposers and 3D stacked ICs (3D SICs) has been at the top of many industry experts’ laundry list of ‘what’s-holding-up-commercialization for 3D’. First, there are technology issues: fine-pitch probing, pin count, contact force and the phenomenon of weak...

3D Test Community Addresses Requirements for 3D Volume Production Testing

Don’t let the skeptics fool you, contrary to popular belief, the 3D test community has been hard at work on solutions for overcoming 3D test challenges. I am attending The Fourth IEEE International Workshop on testing 3D Stacked ICs (3D Test Workshop for short) at the Disneyland Hotel in Anaheim,...