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design-for-test

Affordable and Comprehensive Design-for-Test of 3D Stacking Die Devices

The semiconductor industry has made great strides in ASIC technology over the last 40 years, leading to better performance. But as Moore’s law nears its limits, scaling devices is becoming harder. Shrinking devices now takes longer, costs more, and presents challenges in technology, design, analysis, and manufacturing. Developers of high-end...

Semiconductor Companies Participate in the 4th China International Import Expo

The 4th CIIE was held successfully, let’s see which semiconductor companies appeared at the event. The opening ceremony of the 4th China International Import Expo (CIIE) and Hongqiao International Economic Forum was held in Shanghai on November 4th, 2021. Nearly 3000 exhibitors from 127 countries and regions appeared, and the...

Enabling Next Generation of FO-PLP and IC-Substrates

EVATEC AG, a leading supplier of thin film equipment and process solutions in Advanced Packaging, Semiconductor, Optoelectronics and Photonics applications, has successfully completed the installation of a Clusterline 600 Panel Level Packaging Etch system at Fraunhofer IZM, Berlin. The CLN600 platform is a dedicated Etch and Sputter equipment for FO-PLP...

How to Transform Innovative Technologies Into Customer-Specific Solutions

Technology innovations don’t reach customers right away. Since 1980 I have observed how our industry has improved key parameters like cost per function, power dissipation, form-factor, complexity and clock-speed by many orders of magnitude. However, every new technology took at least several years, sometimes more than a decade, until it...

CoolCube™: A True 3DVLSI Alternative to Scaling

Stacking transistors on top of each other sequentially in the same front-end process flow is a concept that has been imagined to provide the semiconductor community with an alternative to the traditional scaling paradigm challenged by technical and cost roadblocks. LETI Advanced CMOS Laboratory introduced CoolCube™, a low-temperature process flow that provides...

3D Integration Workshop Faces Reliability Challenges Head On

The Friday 3D Integration Workshop at DATE 2014 once again found me among friends, as an intimate group of about 30 gathered to spend a day sharing knowledge gained since last year’s workshop. My key take-away for the day was how to achieve reliability and robustness. Jürgen Wolf, director of...

Making Progress with 3D IC Design and Test

Thank you, Ann Steffora Mutschler (Semiconductor Engineering) for getting to the bottom of the difference of EDA tools for  2.5D and 3D IC design and test, and providing such a clear explanation in your post, “Evolution vs. Revolution”. In this 2-part post, Mutschler explores the EDA vendor arguments that “tool...

Fraunhofer EMFT: 25 years of 3D Integration in Munich

Wouldn’t it be great to get a text notification that you are almost out of toilet paper at home rather than when it’s well… almost too late? Or how about an intra-nasal sensor that detects the level of acetone in your breath to tell you if you’re accumulating or burning...

The 411 on CEA Leti’s Interposer Roadmap

When is an active die not an active die? When it’s an active interposer, of course! Ever since Nicolas Sillon, former head of CEA Leti’s 3D Integration program, first talked about the research institutes’ work with interposer technology for 3D integration, the term “active interposer” has sparked controversy and begged for definition....

A Glossary of 3D Packaging Related Terms and Acronyms

2.5D Interposer: A configuration where dies are mounted side by side on one side of a thin (~ 100 um) silicon, glass, or organic interposer using through silicon vias (TSVs), through glass vias (TGV) or through substrate vias (TSV), respectively through the interposer to connect the dies with the package...