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Materials

Brewer Science Showcases Advanced-Node and Wafer-Thinning Materials for Energy-Efficient Semiconductor Manufacturing

Visit Booth #B1465 at SEMICON Europa to explore PFAS-free, high-performance materials enabling next-gen AI packaging Brewer Science, Inc., a global leader in developing and manufacturing innovative materials for micro- and optoelectronics, will exhibit its latest advancements in sustainable lithography processes at SEMICON Europa 2025. Attendees are invited to visit Brewer...

SEMICON West… It’s Back! Community Member Preview

We presume all are excited about the upcoming SEMICON West show. I know we sure are! Be sure to stop by the 3D InCites booth #731 and say hi or if you are walking by the SEMI booth Francoise may be in action recording a Podcast, acting as the official...

CyberOptics to Present Fast, 100% Wafer Bump Metrology and Inspection at Virtual IEEE PAINE Conference

Minneapolis, Minnesota— November 18th, 2020 — CyberOptics® Corporation a leading global developer and manufacturer of high-precision 3D sensing technology solutions, will present at the Virtual IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE) on December 16th at 8:00amCT. Tim Skunes, VP of R&D at CyberOptics, will share the technical presentation...

Cost Analysis of a Wet Etch TSV Reveal Process

Through silicon via (TSV) technology is a key design element being incorporated into more and more advanced packaging designs today. TSVs offer distinct benefits in form factor and improved performance and can enable new, innovative designs not previously possible. To scale this valuable technology and spark industry adoption, there is...

Rudolph Secures $17M in Orders for Inspection of Critical Advanced Packaging Applications

Flanders, New Jersey (April 1, 2015)—Rudolph Technologies, Inc. (NYSE: RTEC) announced that a major semiconductor foundry and a top outsourced semiconductor assembly and test (OSAT) facility have placed multi-million dollar orders totaling approximately $17M for several NSX® Series and Wafer Scanner™ inspection systems. Several systems were shipped in the first quarter...

SEMATECH to conduct rigorous manufacturability assessments to enable high volume manufacturing readiness of 3D technology

To enable high-volume production readiness of 3D-based products, SEMATECH’s 3D Interconnect and Manufacturability programs will be conducting Equipment Maturity Assessments (EMAs) of several critical 3D tools during 2012 to establish functional equipment capabilities and address high volume manufacturing maturity issues. The assessment is a cooperative effort among experts from SEMATECH’s...

STATS ChipPAC Celebrates Grand Opening of 300mm eWLB Facility

The official inauguration of STATS ChipPAC’s 300mm eWLB facility was held September 15, at the company's Yishun facility in Singapore with more than 150 local dignitaries, customer representatives, business partners and management participating. In April of 2010, STATS ChipPAC established itself as the first in the world to implement 300mm...