Process Control and Inspection for High-Value Advanced Packages: It’s Complicated
Oct 15, 2020 · By Francoise von Trapp · Test and Inspection
Latest Posts - Page 2
Progress Reports for 3D IC Thermal Management and Test
In Jan Vardaman’s recent readiness report card issued at 3D ASIP in December, 3D IC thermal management issues scored and...
3D TSV Test Approaches: Outlook for 2014
Metrology, process control, and electrical test are key enablers for the success of the semiconductor industry. 3D integration using TSVs...
Rudolph Technologies’ Metrology, Inspection and Lithography Solutions for 2.5D and 3D TSVs
Here’s one thing the team at Rudolph has a firm grasp on: understanding that feature sizes of today’s wafer-level, 2.5D...
Probing Questions at the IEEE 3D IC Test Workshop
As this year’s 3D IC Test Workshop unfolded (September 12 & 13, 2012), one thing became increasingly clear to me:...
Multitest’s Next Phase: An Interview with Reinhart Richter
This past July, I visited Multitest’s San Jose location to learn about the company’s activities in 3D IC test, as...
Multitest: Handling the Mobility Market
What better way to wrap up a busy week at SEMICON West 2013 than a site visit? After three days of...
FormFactor Tackles Probe Test for 3D ICs
This is part of a series of short interviews, based on face-to-face meetings at SEMICON West 2013. For a long...
NORDSON: Newcomers to 3D ICs
This is part of a series of short interviews, based on face-to-face meetings at SEMICON West 2013. As 3D ICs...
Late Breaking SEMICON West News: Expert TechHUBs Added to this Year’s Agenda
New this year at SEMICON West, and just introduced to the program late last week, the Expert TechHUBs will help...
Momentum Builds for the 2013 3D InCites Awards
Subscribers are practically blowing up 3D InCites as they duke it out online and race the July 3rd deadline for...
FormFactor: NanoPierce Contactor
Product Description FormFactor’s NanoPierce™ contactor is a socket solution for direct testing of TSVs and micro-bump arrays for 3D IC... Metryx: Mentor Mass Metrology Tool
Product Description Mass metrology is the measurement of the mass change on a wafer as a result of a wafer...
2013 3D Test Workshop Call for Papers
The 2013 3D-TEST Workshop focuses exclusively on test of and design-for-test for three-dimensional stacked ICs (3D-SICs), including Systems-in-Package (SiP), Package-on-Package...
ECTC 2013 Interview: Multitest Execs Tout Partial Stack Test for 3D ICs
Those of us following 2.5D and 3D ICs have been holding our breath waiting for test solutions to appear amidst...
A Lull in 3D Activity or Stealth Mode?
An industry colleague commented to me recently that the press seems to have lost interest in 3DIC. As probably the... Rudolph Acquires Assets of Tamar Technologies
Rudolph Technologies, Inc., known for its process characterization, photolithography equipment and software for the semiconductor, FPD, LED and solar industries,...
Interconnectologists and Market Analysts See Eye to Eye on The Changing IC Industry at BiTS Workshop
Every year in early March, I spend a day at the BiTS Workshop (Burn-in Test Strategies), not because it’s a...
2013 Predictions for 3D ICs as reported by SPN
While most of the semiconductor trade publications wrapped up their 2013 prediction posts by mid January, Semiconductor Packaging News (SPN) forged...