Erik Jan

About Erik Jan

About Erik Jan

Erik Jan Marinissen is Scientific Director at imec in Leuven, Belgium, where he is responsible for research on test and design-for-test, covering topics as diverse as 3D-stacked ICs, silicon photonics, CMOS technology nodes below 10nm, and STT-MRAMs. In addition, he holds the position of Visiting Researcher at Eindhoven University of Technology (TU/e) in the Netherlands. Previously, he worked at NXP Semiconductors and Philips Research Laboratories in Eindhoven, Nijmegen, and Sunnyvale. He holds an MSc degree in Computing Science (1990) and a PDEng degree in Software Technology (1992) from TU/e. Marinissen has an extensive publication record, co-authoring more than 285 journal and conference papers and being involved in the invention of eighteen US/EP patent families.

Marinissen has played significant roles in standardization and academic initiatives. He served as Editor-in-Chief of IEEE Std 1500™-2005, which focuses on embedded core test access, and initiated and chaired IEEE Std 1838™-2019, addressing 3D test access. Additionally, he founded workshops such as ‘Diagnostic Services in Network-on-Chips’, ‘3D Integration Workshop’, and the IEEE ‘International Workshop on Testing Three-Dimensional Stacked ICs’. Marinissen has also taken on key positions as Program Chair and General Chair for several conferences, including DDECS, ETS, 3D-TEST, 3DC-TEST, DATE, ETW, DSNOC, and 3DIW. Moreover, he serves on various conference committees, contributing to events such as ATS, DATE, ETS, ITC, ITC-Asia, and VTS. Marinissen serves on the editorial boards of IEEE ‘Design & Test’ and Springer’s ‘Journal of Electronic Testing: Theory and Applications’.

Throughout his career, Marinissen has received numerous prestigious awards, including Best Paper Awards at various conferences and symposiums. Both in 2008 and 2010, he won the Most Significant Paper Awards at the IEEE International Test Conference (ITC). In 2017, he received both the National Instruments’ Engineering Impact Award and the IEEE Standards Association’s Emerging Technology Award. At ITC 2021, Marinissen received the TTTC Bob Madge Innovation Award. Notably, he was recognized as the most-cited author of ITC papers from 1995 to 2019 on ITC’s 50th anniversary in 2019. He is also included in the list of “Top-2% Scientists World-Wide in All Disciplines” published by Elsevier and Stanford University. Marinissen is a Fellow of IEEE, a Distinguished Contributor Charter Member, and a Golden Core Member of IEEE Computer Society. He served as an elected member of the IEEE Computer Society’s Board of Governors from 2019 to 2021. Marinissen has shared his expertise on Core-Based SOC Test, 3D-SIC Test, and Improving ATPG Test Quality through tutorials at various international conferences and in-house company courses.

As an educator, Marinissen has supervised over 50 international MSc and PhD students, fostering their growth and development in the field. Notably, Dan Adolfsson, one of his MSc students from Linköping Universitet in Sweden, received the “Sveriges Ingenjörer ‘Lilla Polhempriset’” in 2007 for his outstanding MSc graduation project supervised by Marinissen at NXP Semiconductors. Furthermore, Lizhou Wu, a PhD student at TU Delft in the Netherlands, was honored with the TTTC Edward J. McCluskey Best Doctoral Thesis Award in Test at ITC in 2021 for his exceptional PhD thesis titled “Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions”, which received a “cum laude” distinction.

Erik Jan News