Revealing the Invisible: Optimized nano-CT Case Studies in Advanced Packaging
Jul 01, 2025 · By Excillum · 3D In-Depth, Test and Inspection
3D Workshop organizers Erik Jan Marinissen (IMEC), Yann Guillou (ST-Ericsson) Geert Van der Plas (IMEC) report back from a...
Metrology is consistently one of the more challenging areas in the semiconductor field. Whether it’s the monitoring of ultra-small...