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Materials for Hybrid Bonding Presented by Brewer Science at IMAPS 2024

Experience higher integration density and improved performance through hybrid bonding techniques Brewer Science, Inc., a pioneer in temporary bonding and materials for the semiconductor industry, is presenting Materials for Hybrid Bonding at IMAPS Symposium 2024 on October 1st, 2024 at 1:15 pm (EST). Challenges for High-Temperature Processing in Semiconductor Packaging Traditional high-temperature processing poses...

EV Group Highlights 3D Integration Process Solutions at SEMICON Taiwan 2024

Presentations to highlight breakthrough capabilities of EVG’s maskless lithography, hybrid bonding and IR laser release solutions for heterogeneous integration; EVG sees continued strong growth in region EV Group (EVG) today announced that it will highlight key advances in 3D integration process solutions, including hybrid and fusion wafer bonding, infrared (IR)...

Layer Release

EV Group Doubles Throughput of Innovative Semiconductor Layer Transfer Technology

The dedicated HVM EVG®880 LayerRelease™ system boosts productivity and lowers the cost-of-ownership of novel infrared laser release technology through silicon carrier wafers for 3D integration applications EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology, and semiconductor markets, today introduced the EVG®880 LayerRelease™...

PROPHESEE Joins IRT Nanoelec 3D Integration Program

PROPHESEE Joins IRT Nanoelec 3D Integration Program Will Work with CEA-Leti, STMicroelectronics, Mentor, EVG, and SET to Develop New 3D Event-Based Vision System GRENOBLE, France – Oct. 14, 2019 – PROPHESEE, the inventor of the world’s most advanced neuromorphic vision systems, joins the IRT Nanoelec consortium to help broaden the...

The Cost of 3D ICs

When 3D integration has been discussed in the past, whether in terms of a true 3D IC stack or an interposer-based design, the cost of 3D ICs has not always been part of the discussion. In the past couple of years, as 3D ICs have moved closer to reality, more attention...

3D TSV Test Approaches: Outlook for 2014

Metrology, process control, and electrical test are key enablers for the success of the semiconductor industry. 3D integration using TSVs offers new challenges in this area that need solutions. There seems to be industry consensus that it is extremely difficult to perform a wafer-level test that ensures the complete functionality of...

EV Group Unveils New Via-Filling Process to Improve Reliability of 3D-IC / TSV Packaging

Semicon Taiwan, Taipei, September 4, 2013 — EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, today unveiled a new polymer via-filling process for 3D-IC/through-silicon-via (TSV) semiconductor packaging applications.  Available on the EVG100 series of resist processing systems, the new...