Processes and Technology

Replacing NMP: Are You Ready?

NMP is an abbreviation for N-methyl-2-pyrrolidone (other synonyms are 1-Methyl-2-pyrrolidone and 1-Methyl-2-pyrrolidinone) (Figure 1). NMP has proven itself as an effective and versatile cleaning agent, removing photoresist residue while leaving the surface in good shape for processing steps downstream. However, its time may be short-lived as companies strive to meet...

The Fundamentals and Early History of Quantum Mechanical Tunneling

The mid-1920’s were the miracle years for quantum mechanics. The “Old Quantum Theory” originating with Niels Bohr, had reached crisis point by the end of 1924. Wave-particle duality from Einstein and de Broglie called for something new. The great theorists, Heisenberg, Born, Jordan, Schrödinger, and Dirac, published different formulations of a new theory that were quickly shown to be equivalent descriptions of quantum...

 Integrated Solid-state Capacitors Based on Carbon Nanostructure 

The constant demand for miniaturization, added functionality and increased performance of electronic devices systematically drives higher integration by adding more devices on a single chip. In addition, 3-D or 2.5-D packaging, require on-chip or in-package capacitors, not only in traditional integrated circuits but also for integrated components, possibly on interposers,...

Lam Research: SABRE 3D

SABRE® 3D is a next-generation electroplating product designed to meet leading-edge production requirements for advanced packaging applications.  This product leverages proprietary front-end manufacturing technology and offers market-specific solutions for copper pillar and through-silicon via (TSV) fabrication.  SABRE 3D offers industry-leading throughput along with reduced cost of consumables to enable high economic value...

SPTS: Sigma fxP PVD with Multi-Wafer Degas

SPTS’s Sigma® fxP, is a well established PVD system used in advanced packaging applications such as UBM and RDL. It utilizes batch degas technology that can improve Rc whilst maintaining high throughputs, despite the outgassing challenges posed from the increasing use of organics, such as mold in Fan-Out WLP. Testimonial...

KLA-Tencor: CIRCL-AP™

CIRCL-AP™ is a cluster tool with multiple modules, covering all-surface inspection, metrology and review at high throughput for efficient advanced wafer level packaging (AWLP) process control. The CIRCL-AP provides production-proven, high sensitivity monitoring capability for multiple AWLP applications including 2.5D/3D integration, wafer-level chip scale packaging and fan-out wafer-level packaging. Testimonial...

SSEC: Wet Etch Process for TSV Reveal

SSEC’s wet TSV reveal process achieves -/+ 0.7% Si thickness uniformity under the appropriate post grinding conditions with fast throughput. The two-step process starts with a spin etch for a smooth, fast etch at 10µm/min. The etch is stopped 2µm above the TSVs and then finishes with a selective etch...

Akrion Systems: Vacuum Prime and Dry

Akrion Systems’ vacuum prime and drying technology enables the use of a wet immersion method to introduce liquid chemicals or rinse water throughout the entire HAR feature prior to the oxide etching step.  Pulling a vacuum below the saturated vapor pressure of water, draws liquid into the entire feature, enabling...

SETNA: Process for Room Temperature 3D IC Assembly

SETNA, in conjunction with Research Triangle Institute (RTI), has developed a binary alloy (Silver-to-Indium) bonding system for 3D IC assembly that can be compression-bonded at room temperature. Following 3D IC chip stacking, the Ag-In structure is annealed in the solid-state (no melting) to form an Ag₂In interconnect which is stable...

SPTS: Blanket Silicon Etch Process for Via Reveal

The blanket silicon etch process performed on the SPTS Rapier XE achieves an etch rate >8.5µm/min, high selectivity (Si:SiO>150:1), and is ~3-4x faster than competing systems. A unique dual plasma source design creates a uniform etch (<±3%) across a 300mm wafer, which can be “tuned” to compensate for variations in in-coming...

SSEC: WaferEtch TSV Revealer

SSEC’s WaferEtch™ TSV Revealer is a single wafer wet processing platform for 3D IC and interposer wet etching applications designed to reduce processing and capital equipment costs. The WaferEtch features superior uniformity of silicon thickness (as low as -/+ 0.7%). Testimonial Via reveal is a critical process step in 2.5D...

Lasertec: BGM300

The BGM300 was designed to enable quick and accurate measurement of Through Si Via (TSV) depths, Si wafer thickness, and Remaining Si Thickness (RST) above TSVs – all essential in a managed backside via reveal process flow. Back grinding errors due to “blind” grinding can lead to significant yield loss....