Nordson DAGE, a division of Nordson Corporation, is pleased to announce its most recent order from a major customer in the semiconductor industry for its XM8000 wafer x-ray metrology tool that will be used for the automatic measurement of wafer bumps and through silicon vias (TSVs) by using 2D and 3D X-ray inspection methods.

“The XM8000 represents an entirely new paradigm using Nordson DAGE’s award winning X-ray technology in the heart of semiconductor manufacture, and that is why our system was selected for this project,” said David Bernard, Business Manager Automated X-ray Systems. “By offering full, non-destructive and automatic metrology, not only can the XM8000 measure the level of voiding in bumps and TSVs, something that is invisible to other test methods, it can also measure their visible critical dimensions. Furthermore it can do all this substantially faster and with greater precision than existing systems.”

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Francoise von Trapp

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