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Koh Young Unveils Breakthrough Innovations at Productronica and SEMICON Europa 2025

Koh Young, the industry leader in True 3D measurement-based inspection and metrology solutions, will showcase a wave of innovations at Productronica and SEMICON Europa 2025, taking place November 18–21 at Messe München, Germany. Visitors can explore Koh Young’s latest advances in electronics manufacturing and semiconductor packaging at Booth A2.377 for...

MacDermid Alpha Showcases Breakthrough Materials for Advanced Packaging and Power Semiconductors at SEMICON Taiwan

MacDermid Alpha presents advanced packaging and power semiconductor materials at SEMICON Taiwan, highlighting reliability, sustainability, and expert insights at the TechXPOT forum. MacDermid Alpha Electronics Solutions, a leading supplier of integrated materials and chemistries to the electronics industry, will showcase its advanced packaging solutions for next-generation semiconductor devices at the...

Materials

Indium Corporation to Showcase Innovative Materials Enabling AI Technology at SEMICON Taiwan

Indium Corporation®, a leading materials refiner, smelter, manufacturer, and supplier to the global electronics, semiconductor, AI, thin-film, and thermal management markets, will showcase its heterogeneous integration and assembly (HIA) products and thermal interface materials (TIMs) at SEMICON Taiwan, to be held September 10-12 in Taipei, Taiwan. Indium Corporation specializes in semiconductor...

At the Crossroads of CVD and ALD, KOBUS Makes its Mark on 3D TSVs

Last July at SEMICON West, I was honored to witness the dramatic unveiling of UnitySC, the new company formed as a result of Fogale Group’s acquisition of Altatech, resulting in a semiconductor equipment portfolio that spans the spectrum of process control needs for advanced wafer-level and 3D packaging, including metrology,...

Fine Tuning Processes for TSV Reveal

Through silicon via (TSV) reveal is a critical part of the wafer-thinning step in 3D IC backside processing, where the wafer is thinned to expose the Cu “nails” that ultimately form the interconnect between die stacks. Some of the risks involved in this step include backside contamination (Cu diffusion) due...

Catching up with EV Group’s Dave Kirsch

Almost a year ago, Dave Kirsch took over the reins from Steve Dwyer as VP and General Manager of EV Group North America. Since EV Group launched a tool last week at SEMICON Singapore, and since EVG NA’s headquarters are practically in 3D InCites’ back yard, I thought it was...

Willkommen in Österreich!

Note to self: when visiting a class 10 clean room that requires full clean room attire (bonnet, booties, coverall, hood and boots) don’t wear a skirt!