Erik Jan Marinissen is scientific director at imec in Leuven, Belgium, and a visiting researcher at the Eindhoven University of Technology (TU/e), The Netherlands. His research interests comprise all topics related to testing and the design-for-test of digital ICs for manufacturing defects. Marinissen has an MSc and a PDEng in computer science and software technology from TU/e. Marinissen is a Fellow of IEEE and served as Editor-in-Chief of IEEE Std 1500 on embedded core test, Founder and Chair (currently Vice-Chair) of IEEE Std 1838 on 3D test access, and Vice-Chair of IEEE Std P3405 on chiplet interconnect test and repair.
Testing the limits: standardization and optimization of chiplet test protocols Chiplets often come from different sources, making electrical testing challenging....
IEEE P3405: Chiplet Interconnect Test and Repair Working Group (CITR-WG) Sponsoring Society and Committee: IEEE Test Technology Standards Committee (TTSC)...