Thermal Management of ICs During Testing – Too Hot to Test – A MEPTEC Virtual Event
MEPTEC to host a virtual event entitled, “Too Hot to Test,” exploring the thermal management of ICs during testing. This virtual event will be held online February 9 – 10, 2021.
As the industry moves to develop creative artificial intelligence (AI) and other advanced computing devices, the power consumption per semiconductor device has skyrocketed. This brings with it challenges in power delivery as well as device cooling. Join us as we explore the challenges associated with testing high-power devices focusing on chips, die stacks and multi-chip modules.
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