As one of Amkor’s leading “Test Technologist”, Gerard’s expertise covers a wide range of products and services, including: commercial MEMS devices, 77 GHz collision-avoidance radar, high speed photonics and wireless cellular communications products. He has additional proficiency in System Level Test, with a primary focus on test innovation and providing solutions that lower test costs. Gerard strives to engage early with MEMS design engineers to understand the platform architecture, functionality and final use application, review test requirements, design and develop device validation fixtures (bench top setups) that can be migrated to a HVM test solution. By including these Design For Test (DFT) capabilities, the goal of potential massive parallel test increasing throughput and reducing overall test costs can be realized. He has more than 20 years of product and test development experience and holds several patents on RF and MEMS test technologies. Gerard holds a bachelor’s degree from Osmania University and an MBA from Gainey School of Business.