Nov 14 (EU) / Nov 16 (US) / Nov 21 (Asia)
The 2023 COMPASS Theme is Megatrends in Test and Measurement
FormFactor’s COMPASS test and measurement community event brings together FormFactor customers from around the
world to discuss the products and technologies shaping our future. Industry leaders and speakers from corporations,
leading-edge research institutions and FormFactor share test insights on a wide variety of emerging applications
including 5G, trends in advanced packages, next generation memories and other devices, ultra-low noise testing,
cryogenic probing and millimeter-wave measurement and calibration.
Register NOW
Two Ways to Participate in COMPASS 2023!
Virtual – Enjoy COMPASS wherever you are.
A link will be provided for you to join from your device.
Watch Party – Join us at one of our watch party locations throughout the world.
Hear COMPASS presentations and network with attendees and technical staff.
All COMPASS events are no charge
KEYNOTE SPEAKER
Advanced Packaging: Enabling Moore’s Law’s Next Frontier
Dr. Deepak Kulkarni
Agenda
12:30pm – Registration for on-site “watch party” participants
1:00pm – Welcome & Executive Address
1:05pm – Keynote Presentation – Advanced Packaging: Enabling Moore’s Law’s Next Frontier
1:40pm – Pyramid Probe: RF Calibration and Probe Aging Considerations in HVM High Speed IO Devices
2:05pm – How FormFactor’s Known Good Die Test Enables Advanced Packaging for High Bandwidth Memory – Solutions and Latest Trends
2:25pm – Break
2:30pm – Pharos Vertical and Edge Coupling Low Loss SiPh Wafer Test with Fully Automated Calibration – From Probe Install to Successful V-groove Wafer Level Test in 90 Minutes
2:55pm – Measuring Superconducting Material Properties for Cryogenic Chip Development
3:15pm – Maximizing CCC in a Probe Card and the March to an Unburnable Probe
3:45pm – Break
3:50pm – Achieving Traceable RFCMOS Ft and Fmax Wafer Measurements
4:15pm – Simplifying Photonic Test & Measurement at Cryogenic Temperatures
4:30pm – Next Generation DC Probes for Accurate and Repeatable Device Modelling Measurements
5:00pm – Closing Comments
5:00pm – Reception Happy Hour
