3D Topics

ECTC 2015: From the Tech Sessions Part 2

As promised in part 1 of my ECTC 2015 blog about this impressive conference, see below summaries of presentations I found very useful to contribute to the advancement of single- and multi-die packaging. To make it easier for the reader to dig deeper and review the entire paper, I included in...

Catching Up with Robert Andosca / MicroGen: Agnostic Power to the IoT

3D InCites / 3D+ recently had the opportunity to visit Dr. Robert Andosca, co-founder, president, and CEO of MicroGen Systems, Inc., at MicroGen’s headquarters in the High Tech Rochester Lennox Tech Enterprise Center, just off the Rochester Institute of Technology campus in Henrietta (Rochester), NY. To devotees of film, particularly...

ECTC 2015: Advanced Packaging Sets Sail in San Diego

The 65th annual Electronics Technology Components Conference (ECTC 2015) logged record numbers (over 1500 attendees, 20% increase over last year) as the entire semiconductor industry recognizes (finally) that there is indeed money to be made in the advanced packaging sector. The flip chip and wafer level packaging sessions were full to...

Strength Through Consolidation in MEMS and Sensors: MIG Adds TSensors Division, Accelerating a World of “Abundance”

MEMS Industry Group®, the trade association advancing MEMS and sensors across global markets, announced the creation of its new TSensors division on May 14,  2015; headed by Dr. Janusz Bryzek, TSensors Summit, Inc.’s founder. MIG’s new division will extend TSensors Summit’s visionary efforts to accelerate a world in which everyone...

IoT: Beyond the Hype

All the hype surrounding the Internet of Things has me worried. First of all, its my opinion that the motivation behind the IoT is not necessarily to our benefit. Call me a skeptic, but as I see it, like snake oil, we’re being sold on the notion that the IoT...

Omnivision: OV23850 PureCel Image Sensor

OmniVision’s OV23850 PureCel image sensor utilizes the companies advanced stacked die process capture exceptional images and video in 23.8-megapixel resolution while maintaining a compact form factor, which is critical for the next-generation of slim smartphones and tablets. Testimonial OmniVision’s family of PureCel backside-illuminated image sensors use the company’s stacked die...

Spotlight on FOWLP, Monolithic 3D IC and 3D TSVs

Fan-out wafer level packaging’s star is clearly on the rise as a low-cost solution for consumer mobile products, and the semiconductor industry trade news has been buzzing with unsubstantiated claims that Qualcomm is ditching through silicon vias (TSVs) for monolithic 3D ICs (M3D) in its next generation of cell phones....

3D InCites Turns Six and Hits Over 1000 Posts

Today, LinkedIN reminded me that 3D InCites just celebrated its 6th anniversary. I also noticed that Paul Werbaneth’s latest 3D+ post, Japan, Abenomics, IoT, and the MEMS Engineer Forum 2015, was the 1001st post to be published on the site. That’s a lot of talk about 3D integration, from processes...

Japan, Abenomics, IoT, and the MEMS Engineer Forum 2015

MEMS sensors, and the Internet of Things data they feed to the cloud, are being called on to jumpstart the world’s third largest economy. The economic revitalization strategy being instituted by Japanese Prime Minister Shinzo Abe, and now being carried out in Japan under the moniker “Abenomics,” consists of Three...

What’s In Store for Attendees at ECTC 2015

ECTC 2015 returns to my favorite of its three rotating locations at the Sheraton San Diego Hotel and Marina almost exactly one month from now, May 26-29, 2015. This year, the ECTC technical committee has selected 350 papers on topics related to 3D and TSV technologies, wafer level packaging, electrical and...

EDPS 2015 Looks At IC Innovations from the Design Perspective

On Thursday and Friday of last week, Monterey, California’s previous state capital, became the center of presentations and discussions about IC design challenges as well as latest innovations / progress made in the field of EDA tools and IC design methodologies at Electronic Design Process Symposium (EDPS) 2015. We also learned a...

Wafer-to-Wafer Bonding Cost Analysis

Last year, I did an analysis that included the topic of wafer-to-wafer bonding. Specifically, it was a comparison of the three variations available when stacking wafers and/or die—wafer-to-wafer (W2W), die-to-wafer (D2W), and die-to-die (D2D). The goal of that project was to build cost models for W2W and D2W (with the...